1. Machine learning in VLSI computer-aided design /
پدیدآورنده : editors, Abrahim (Abe) M. Elfadel, Duane S. Boning and Xin Li.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Integrated circuits-- Very large scale integration-- Computer-aided design.,Machine learning.,Integrated circuits-- Very large scale integration-- Computer-aided design.,Machine learning.,TECHNOLOGY & ENGINEERING-- Mechanical.
رده :
TK7874
.
75
2. System-on-chip test architectures
پدیدآورنده : edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Integrated circuits-- Very large scale integration-- Design,Integrated circuits-- Very large scale integration-- Testing,Systems on a chip-- Testing
رده :
TK7895
.
E42
S978
2008
3. System-on-chip test architectures :
پدیدآورنده : edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Integrated circuits-- Very large scale integration-- Design,Integrated circuits-- Very large scale integration-- Testing,Systems on a chip-- Testing
رده :
TK7895
.
E42
S978
2008
4. System-on-chip test architectures : nanometer design for testability
پدیدآورنده : edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
کتابخانه: Library of Institute for Research in Fundamental Sciences (Tehran)
موضوع : Testing ، Systems on a chip,Testing ، Integrated circuits -- Very large scale integration,Design ، Integrated circuits -- Very large scale integration
رده :
TK
7895
.
E42S97
5. System-on-chip test architectures: nanometer design for testability
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : Testing ، Systems on a chip,Testing ، Integrated circuits-- Very large scale integration,، Integrated circuits-- Very large scale integration-- Design
رده :
TK
7895
.
E42
.
S978
2008
6. VLSI:
پدیدآورنده : edited by Ricardo Reis, Luc Claesen.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Computer science.,Information storage and retrieval systems.
رده :
TK7874
.
75
E358
1997
7. VLSI design and test for systems dependability /
پدیدآورنده : Shojiro Asai, editor.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Integrated circuits-- Very large scale integration-- Design and construction.,Integrated circuits-- Very large scale integration-- Testing.,Integrated circuits-- Very large scale integration-- Design and construction.,Integrated circuits-- Very large scale integration-- Testing.,TECHNOLOGY & ENGINEERING-- Mechanical.
رده :
TK7874